MIL-STD-883F

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MIL-STD-883F, DEPARTMENT OF DEFENSE TEST METHOD STANDARD: MICROCIRCUITS, TEST STANDARDS (18 JUN 2004) [S/S BY MIL-STD-883G]., This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic environmental tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations, mechanical and electrical tests workmanship and training procedures and such other controls and constraints as have been deemed necessary to ensure a uniform level of quality and reliability suitable to the intended applications of those devices.

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标准名称：	阴极射线管外形图的绘制
英文名称：	Preparation of outline drawings of cathode-ray tubes
中标分类：	电子元器件与信息技术 >> 电真空器件 >> 电子束管
替代情况：	调整为SJ/T 11081-1996
发布日期：	1989-03-21
实施日期：	1990-03-01
首发日期：
作废日期：	1997-01-01
出版日期：
页数：	6页