ASTM F744M-1997(2003) 数字集成电路的干扰用剂量阈值测量的标准试验方法(米制)

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【英文标准名称】:StandardTestMethodforMeasuringDoseRateThresholdforUpsetofDigitalIntegratedCircuits[Metric]
【原文标准名称】:数字集成电路的干扰用剂量阈值测量的标准试验方法(米制)
【标准号】:ASTMF744M-1997(2003)
【标准状态】:现行
【国别】:
【发布日期】:1997
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:F01.11
【标准类型】:(TestMethod)
【标准水平】:()
【中文主题词】:集成电路;辐照度;剂量测定;数字电路;试验;电压
【英文主题词】:DIC;digitalintegratedcircuits;doserate;ionizingradiation;radiationdoserate;thresholdforupset;upset
【摘要】:1.1Thistestmethodcoversthemeasurementofthethresholdlevelofradiationdoseratethatcausesupsetindigitalintegratedcircuitsunderstaticoperatingconditions.TheradiationsourceiseitheraflashX-raymachine(FXR)oranelectronlinearaccelerator(LINAC).1.2Theprecisionofthemeasurementdependsonthehomogeneityoftheradiationfieldandontheprecisionoftheradiationdosimetryandtherecordinginstrumentation.1.3Thetestmaybedestructiveeitherforfurthertestsorforpurposesotherthanthistestiftheintegratedcircuitbeingtestedabsorbsatotalradiationdoseexceedingsomepredeterminedlevel.Becausethisleveldependsbothonthekindofintegratedcircuitandontheapplication,aspecificvaluemustbeagreeduponbythepartiestothetest(6.8).1.4Setup,calibration,andtestcircuitevaluationproceduresareincludedinthistestmethod.1.5Proceduresforlotqualificationandsamplingarenotincludedinthistestmethod.1.6Becauseofthevariabilityoftheresponseofdifferentdevicetypes,theinitialdoserateforanyspecifictestisnotgiveninthistestmethodbutmustbeagreeduponbythepartiestothetest.1.7Thisstandarddoesnotpurporttoaddressallofthesafetyconcerns,ifany,associatedwithitsuse.Itistheresponsibilityoftheuserofthisstandardtoestablishappropriatesafetyandhealthpracticesanddeterminetheapplicabilityofregulatorylimitationspriortouse.
【中国标准分类号】:L56
【国际标准分类号】:
【页数】:6P.;A4
【正文语种】: